• DocumentCode
    1751987
  • Title

    Interaction depth in CdTe/CdZnTe spectrometers by electron drift time

  • Author

    Li, W. ; He, Z. ; Knoll, G.F. ; Wehe, D.K.

  • Author_Institution
    Michigan Univ., Ann Arbor, MI, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Abstract
    This paper introduces a method to determine the interaction depth in 3-D position sensitive gamma-ray spectrometers through the measurement of the electron drift time. In this method, the electron drift time is measured as the time interval between the leading edges of the signals from the cathode and the anode pixel. As an implementation, a self-triggered VA-TA DAQ system with 128 independent timing channels has been developed to read out the timing when the signal leading edges cross a pre-selected threshold. Each timing channel has a dynamic range of 14 us and a timing resolution of ~60 ns. This VA-TA DAQ system is applied to a 2×2×1.5 cm-3 CdTe detector with an pixellated anode array. For signals from a particular pixel, the distribution of the measured electron drift time matched the expected distribution. The energy spectra from different interaction depths are separated by the measured electron drift time. For multiple interaction events involving multiple pixels, the reconstruction of the interaction depths based upon the electron drift times is being investigated. The results will be presented
  • Keywords
    data acquisition; gamma-ray detection; gamma-ray spectrometers; nuclear electronics; position sensitive particle detectors; semiconductor counters; 1.5 cm; 2 cm; 3D position sensitive gamma-ray spectrometers; CdTe-CdZnTe; CdTe/CdZnTe spectrometers; electron drift time; energy spectra; interaction depth; multiple pixels; self-triggered VA-TA DAQ system; Anodes; Cathodes; Data acquisition; Dynamic range; Electrons; Energy resolution; Position measurement; Spectroscopy; Time measurement; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2000 IEEE
  • Conference_Location
    Lyon
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-6503-8
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2000.949042
  • Filename
    949042