DocumentCode
1751993
Title
Thin CVD diamond detectors with high charge collection efficiency
Author
Brambilla, A. ; Tromson, D. ; Bergonzo, P. ; Mer, C. ; Foulon, F.
Author_Institution
Lab d´´Electron. et de Technol. de l´´Inf., CEA, Centre d´´Etudes Nucleaires de Grenoble, France
Volume
1
fYear
2000
fDate
2000
Firstpage
24929
Abstract
We report the measurements of charge collection efficiency for nuclear particle detectors made from electronic grade CVD diamond samples with thicknesses of 20 μm and 150 μm elaborated at CEA/LETI. Although it is well established that the transport properties of CVD diamond, and more specifically the μτ product, tends to improve with the sample thickness, it was observed that excellent collection efficiencies can be achieved on the 20 μm thick detector owing to the reduced inter electrode distance. Due to the polycrystalline nature of CVD diamond, the charge collection efficiency is inhomogeneous throughout the detector surface. However, a mean collection efficiency of 50% was measured over the hole detector surface, with regions close to 100%, corresponding to the highest values reported in literature for CVD diamond. This excellent performance enables the detection of very low energy heavy charged particles with a detection limit well below 200 keV for protons
Keywords
diamond; proton detection; semiconductor counters; 150 micron; 20 micron; 200 keV; C; CVD diamond detectors; charge collection efficiency; muon tau product; Charge measurement; Chemical vapor deposition; Current measurement; Nuclear measurements; Particle measurements; Plasma measurements; Plasma temperature; Protons; Radiation detectors; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location
Lyon
ISSN
1082-3654
Print_ISBN
0-7803-6503-8
Type
conf
DOI
10.1109/NSSMIC.2000.949050
Filename
949050
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