DocumentCode :
1751998
Title :
Simulation of the collection properties of CdTe strip detectors
Author :
Cola, A. ; Quaranta, F. ; Caroli, E. ; Dusi, W. ; Perillo, E.
Author_Institution :
IME, CNR, Lecce, Italy
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
35521
Abstract :
CdTe is an attractive material for X and gamma-ray detectors but the poor transport properties of holes affect the performance by introducing a low energy tailing in the observed spectra. A possible solution to this problem is to optimize the electrode geometry, for example by reducing the dimension of the anode with respect to the cathode. In this way the charge signal in the external circuit is mostly-due to the electrons moving towards the anode that is where the weighing field becomes localized. The optimization of the electrode geometry requires a numerical analysis as the problem is complicated by stochastic trapping and detrapping processes, which are difficult to be treated analytically. In this work we present a numerical simulator based on a finite difference numerical method (which follows the weighing field approach) and on a Monte-Carlo procedure which is able to analyze, in two dimensions, the effect of different electrode configurations: single strip, multiple strip, a single strip with a lateral extended cathode and, for comparison, the uniform geometry. The results are analyzed in terms of the maps of the local charge collection efficiency and their histograms, equivalent to the spectra due to high energy X-rays
Keywords :
Monte Carlo methods; X-ray astronomy; finite difference methods; semiconductor counters; CdTe strip detectors; Monte-Carlo; X-ray astronomy; collection properties; electrode geometry; finite difference; high energy X-rays; lateral extended cathode; multiple strip; numerical analysis; single strip; stochastic detrapping; stochastic trapping; weighing field; Anodes; Cathodes; Circuits; Electrodes; Electrons; Gamma ray detectors; Geometry; Numerical analysis; Stochastic processes; Strips;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
ISSN :
1082-3654
Print_ISBN :
0-7803-6503-8
Type :
conf
DOI :
10.1109/NSSMIC.2000.949055
Filename :
949055
Link To Document :
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