DocumentCode
1752091
Title
Thin photodiodes for a neutron scintillator-silicon well detector
Author
Allier, Cedric P. ; Hollander, R.W. ; van Eijk, C.W.E. ; Sarro, P.M. ; de Boer, M. ; Czirr, J.B. ; Chaminade, J.P. ; Fouassier, C.
Author_Institution
Interfaculty Reactor Inst., Delft Univ. of Technol., Netherlands
Volume
1
fYear
2000
fDate
2000
Abstract
In the development of new neutron imaging applications, it is crucial to achieve a detector-combining high spatial resolution, fast response and high detection efficiency. In order to achieve such features we have proposed a new design for position sensitive radiation sensors, which we called the micromachined Si-well scintillator pixel detector. It consists of an array of scintillator crystals encapsulated in silicon wells with photodiodes at the bottom. In the following we describe such a detector which makes use of a powder of 6Li 6158Gd(BO3)3(Ce3+ ). The first experiments obtained using a thermal neutron beam show the presence of a signal above the detector noise tail. In addition, in order to improve the characteristics of the well-type silicon sensor, we have investigated the deep reactive ion etching on SOI wafers. The process to etch 700 μm wide vertical wells into 500 μm thick silicon wafer has been optimized. Silicon wells with 10 μm thick photodiodes at the bottom have been fabricated by means of this process
Keywords
cerium; lithium compounds; neutron detection; photodiodes; silicon radiation detectors; solid scintillation detectors; 6Li6158Gd(BO3)3 (Ce3+); Li6Gd(BO3)3:Ce; Si; deep reactive ion etching; micromachined Si-well scintillator pixel detector; neutron scintillator-silicon well detector; position sensitive radiation sensors; thermal neutron beam; thin photodiodes; Crystals; Etching; High-resolution imaging; Neutrons; Photodiodes; Position sensitive particle detectors; Radiation detectors; Sensor phenomena and characterization; Silicon; Spatial resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location
Lyon
ISSN
1082-3654
Print_ISBN
0-7803-6503-8
Type
conf
DOI
10.1109/NSSMIC.2000.949156
Filename
949156
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