DocumentCode :
1752117
Title :
Simulation of real-time flaw detecting systems performance
Author :
Potapov, V.N. ; Ivanov, O.P. ; Stepanov, V.E. ; Ignatov, S.M.
Author_Institution :
Kurchatov (I.V.) Inst. of Atomic Energy, Moscow, Russia
Volume :
1
fYear :
2000
fDate :
2000
Abstract :
The software package for modeling of real-time flaw detecting systems performance is described. The systems with following X-ray detectors are considered: industrial X-ray image intensifier+lens+highly sensitive digital CCD; scintillating screen+lens+CCD; one-dimensional arrays of scintillator+photodiode probes. The software package allows determination of different performances of defectoscopes: the spatial resolution, contrast sensitivity for different parameters of explored objects and different parameters of used X-ray emitter. The contribution of a scattering radiation from object and collimators in a total signal on the detector is taken into account
Keywords :
X-ray applications; flaw detection; solid scintillation detectors; X-ray detectors; X-ray emitter; defectoscopes; highly sensitive digital CCD; industrial X-ray image intensifier; real-time flaw detecting systems performance; scintillating screen; spatial resolution; Charge coupled devices; Image intensifiers; Probes; Real time systems; Sensor arrays; Software packages; Spatial resolution; System performance; X-ray detectors; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
ISSN :
1082-3654
Print_ISBN :
0-7803-6503-8
Type :
conf
DOI :
10.1109/NSSMIC.2000.949222
Filename :
949222
Link To Document :
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