DocumentCode :
1752150
Title :
Effect of voxel size in CT simulations
Author :
Goertzen, Andrew L. ; Beekman, Freek J. ; Cherry, Simon R.
Author_Institution :
Crump Inst. for Molecular Imaging, California Univ., Los Angeles, CA, USA
Volume :
3
fYear :
2000
fDate :
2000
Abstract :
In computer simulations of X-ray CT systems one can either use continuous geometrical descriptions for phantoms or a voxelized representation. The voxelized approach allows arbitrary phantoms to be defined without being confined to geometrical shapes. The disadvantage of the voxelized approach is that inherent errors are introduced due to the phantom voxelization. To study effects of phantom discretization, analytical CT simulations were run for a fan-beam geometry with phantom voxel sizes ranging from 0.0625 to 2 times the reconstructed pixel size and noise levels corresponding to 103 to 107 photons per detector pixel prior to attenuation. Differences in the filtered back-projection (FBP) images caused by different phantom matrix sizes were assessed by calculating the difference between reconstructions based on the finest matrix and coarser matrix simulations. In noise free simulations, all phantom matrix sizes produced a measurable difference from the almost continuous case. When even a small amount of noise was added to the projection data, the differences due to the phantom discretization were masked by the noise, and in all cases there was almost no improvement by using a phantom matrix that was more than twice as fine as the reconstruction matrix
Keywords :
computerised tomography; digital simulation; CT simulations; X-ray CT systems; coarser matrix simulations; fan-beam geometry; filtered backprojection images; finest matrix; geometrical shapes; medical diagnostic imaging; noise free simulations; noise levels; reconstructed pixel size; voxel size effect; voxelized representation; Analytical models; Computational modeling; Computed tomography; Computer errors; Computer simulation; Geometry; Image reconstruction; Imaging phantoms; Shape; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
ISSN :
1082-3654
Print_ISBN :
0-7803-6503-8
Type :
conf
DOI :
10.1109/NSSMIC.2000.949326
Filename :
949326
Link To Document :
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