• DocumentCode
    1752159
  • Title

    Parallel analog functional test

  • Author

    Viehland, Jason ; Fairbanks, Stephen

  • Author_Institution
    Teradyne Inc., Agoura Hills, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    616
  • Lastpage
    624
  • Abstract
    The concept of parallel testing is something that means different things to different people. Both commercial and military applications require some level of functional testing to provide end user surety that the product in question will actually perform while in-system. Traditional test approaches mix functional and parametric test techniques while trading off issues such as test system cost and test complexity. The intent of this paper, and its matching presentation, is to review the application of analog functional testing and how it extends into parallel testing framed by today´s test system designs
  • Keywords
    analogue circuits; automatic testing; controllability; fault diagnosis; observability; state-space methods; analog test; commercial applications; control; functional test; military applications; observation; parallel test; state space; system design; Circuit faults; Circuit testing; Cost function; Frequency; Noise level; Performance evaluation; Space exploration; System testing; Test equipment; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
  • Conference_Location
    Valley Forge, PA
  • ISSN
    1080-7225
  • Print_ISBN
    0-7803-7094-5
  • Type

    conf

  • DOI
    10.1109/AUTEST.2001.949446
  • Filename
    949446