Title :
Parallel analog functional test
Author :
Viehland, Jason ; Fairbanks, Stephen
Author_Institution :
Teradyne Inc., Agoura Hills, CA, USA
Abstract :
The concept of parallel testing is something that means different things to different people. Both commercial and military applications require some level of functional testing to provide end user surety that the product in question will actually perform while in-system. Traditional test approaches mix functional and parametric test techniques while trading off issues such as test system cost and test complexity. The intent of this paper, and its matching presentation, is to review the application of analog functional testing and how it extends into parallel testing framed by today´s test system designs
Keywords :
analogue circuits; automatic testing; controllability; fault diagnosis; observability; state-space methods; analog test; commercial applications; control; functional test; military applications; observation; parallel test; state space; system design; Circuit faults; Circuit testing; Cost function; Frequency; Noise level; Performance evaluation; Space exploration; System testing; Test equipment; Voltage;
Conference_Titel :
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location :
Valley Forge, PA
Print_ISBN :
0-7803-7094-5
DOI :
10.1109/AUTEST.2001.949446
