DocumentCode
1752159
Title
Parallel analog functional test
Author
Viehland, Jason ; Fairbanks, Stephen
Author_Institution
Teradyne Inc., Agoura Hills, CA, USA
fYear
2001
fDate
2001
Firstpage
616
Lastpage
624
Abstract
The concept of parallel testing is something that means different things to different people. Both commercial and military applications require some level of functional testing to provide end user surety that the product in question will actually perform while in-system. Traditional test approaches mix functional and parametric test techniques while trading off issues such as test system cost and test complexity. The intent of this paper, and its matching presentation, is to review the application of analog functional testing and how it extends into parallel testing framed by today´s test system designs
Keywords
analogue circuits; automatic testing; controllability; fault diagnosis; observability; state-space methods; analog test; commercial applications; control; functional test; military applications; observation; parallel test; state space; system design; Circuit faults; Circuit testing; Cost function; Frequency; Noise level; Performance evaluation; Space exploration; System testing; Test equipment; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location
Valley Forge, PA
ISSN
1080-7225
Print_ISBN
0-7803-7094-5
Type
conf
DOI
10.1109/AUTEST.2001.949446
Filename
949446
Link To Document