Title :
Single event upset studies under neutron radiation of a high speed digital optical data link
Author :
Andrieux, M.L. ; Dinkespiler, B. ; Evans, G. ; Gallin-Martel, L. ; Lundquist, J. ; Pearce, M. ; Rethore, F. ; Rydström, S. ; Stroynowski, R. ; Ye, J.
Author_Institution :
Inst. des Sci. Nucl., Grenoble, France
Abstract :
The results from a series of neutron irradiation tests of a high speed digital optical data link based on a commercial serialiser, commonly known as `G-link´, and a vertical cavity surface emitting laser are described. The link was developed as a candidate for the front-end readout of the ATLAS electromagnetic calorimeter. The components at the emitting end of the link were unaffected by neutron irradiation levels exceeding those expected during 10 years of LHC running. However, the link suffered from single event upsets (SEU) when irradiated with energetic neutrons. A very general method based on the burst generation rate (BGR) model has been developed and is used to extrapolate the error rate observed during tests to that expected at the LHC. A model independent extrapolation was used to check the BGR approach and the results were consistent. To reduce the SEU rate and the deadtime it implies, a dual G-link system was built and tested with neutron radiation
Keywords :
digital readout; high-speed optical techniques; liquid scintillation detectors; neutron detection; neutron effects; nuclear electronics; optical links; particle calorimetry; surface emitting lasers; 10 y; ATLAS electromagnetic calorimeter; G-link; VCSEL; burst generation rate; commercial serialiser; error rate; front-end readout; high speed digital optical data link; model independent extrapolation; neutron radiation; single event upset studies; vertical cavity surface emitting laser; Error analysis; Extrapolation; High speed optical techniques; Large Hadron Collider; Neutrons; Single event upset; Stimulated emission; Surface emitting lasers; Testing; Vertical cavity surface emitting lasers;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
Print_ISBN :
0-7803-6503-8
DOI :
10.1109/NSSMIC.2000.949859