Title :
A large dynamic range radiation tolerant analog memory in a quarter micron CMOS technology
Author :
Anelli, G. ; Anghinolfi, Francis ; Rivetti, A.
Author_Institution :
EP Div., CERN, Geneva, Switzerland
Abstract :
A 8*128 cell analog memory prototype has been designed in a commercial 0.25 μm CMOS process. The aim of this work was to investigate the possibility of designing large dynamic range mixed-mode switched capacitor circuits for high-energy physics (HEP) applications in deep submicron CMOS technologies. Special layout techniques have been used to make the circuit radiation tolerant. The memory cells employ gate-oxide capacitors for storage, allowing for a very high density. A voltage write-voltage read architecture has been chosen to minimize the sensitivity to absolute capacitor values. The measured input voltage range is 2.3 V (VDC=2.5 V), with a linearity of at least 7.5 bits over 2 V. The dynamic range is more than 11 bits. The pedestal variation is ±0.5 mV peak-to-peak. The noise measured, which is dominated by the noise of the measurement setup, is around 0.8 mV rms. The characteristics of the memory have been measured before irradiation and after 10 Mrd (SiO2), and they do not degrade after irradiation
Keywords :
CMOS analogue integrated circuits; CMOS memory circuits; mixed analogue-digital integrated circuits; nuclear electronics; semiconductor device noise; 10 Mrad; 2.3 V; SiO2; analog memory prototype; deep submicron CMOS; gate-oxide capacitors; high-energy physics; large dynamic range radiation tolerant analog memory; mixed-mode switched capacitor circuit; noise; quarter micron CMOS technology; voltage write-voltage read architecture; Analog memory; CMOS memory circuits; CMOS process; CMOS technology; Dynamic range; Noise measurement; Physics; Prototypes; Switched capacitor circuits; Voltage;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
Print_ISBN :
0-7803-6503-8
DOI :
10.1109/NSSMIC.2000.949861