• DocumentCode
    1752320
  • Title

    Performance analysis of phoswich/APD detectors and low noise CMOS preamplifiers for high resolution PET systems

  • Author

    Lecomte, R. ; Pepin, C.M. ; Lepage, M.D. ; Pratte, J.-F. ; Dautet, H. ; Binkley, D.M.

  • Author_Institution
    Sherbrooke Univ., Que., Canada
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    28369
  • Abstract
    An integrated, 0.8-μ CMOS charge-sensitive preamplifier previously designed for LSO/APD based PET systems has been further investigated for use with multi-crystal/APD PET detectors. In addition to low-noise, wide-band performance and power efficiency, high dynamic range and good signal-to-noise ratio over a broad range of shaping times are required to process the signals from crystals being used in phoswich detectors, which have a wide range of scintillation decay time and light output characteristics. The preamplifier equivalent noise charge (Neq) was measured as a function of input capacitance and amplifier shaping time constant. The performance of the preamplifier was also assessed using APDs coupled to a variety of scintillators. Measurements were obtained at a preamplifier input-device current of 2 and 4 mA. The higher bias lead to marginal improvements of the timing performance but had no effect on energy resolution
  • Keywords
    CMOS integrated circuits; avalanche photodiodes; positron emission tomography; preamplifiers; semiconductor device models; semiconductor device noise; solid scintillation detectors; 2 mA; 4 mA; PET; avalanche photodiode; energy resolution; equivalent noise charge; low noise CMOS preamplifiers; phoswich; phoswich/APD detector; signal-to-noise; timing; Current measurement; Dynamic range; Multi-stage noise shaping; Performance analysis; Positron emission tomography; Preamplifiers; Signal processing; Signal to noise ratio; Solid scintillation detectors; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2000 IEEE
  • Conference_Location
    Lyon
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-6503-8
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2000.949874
  • Filename
    949874