Title :
XPAD, a new read-out pixel chip for X-ray counting
Author :
Blanquart, L. ; Valin, I. ; Trouilleau, C. ; Meillere, S. ; Crest, L.
Author_Institution :
CNRS, Marseille, France
Abstract :
Hybrid pixel detectors featuring a high signal to noise ratio, real 2 dimensional reconstruction and local intelligence, have now been demonstrated to be one of the most powerful trackers for high energy physics experiments. They have, therefore, gained interest in other physics fields and for medical applications. However, the conversion of pixel detectors from high energy physics to X-ray detection is not completely straightforward and new challenges appear. For example, high counting rates, wide dynamic ranges and low detection levels are required. “XPAD” (X-ray Pixel Chip with Adaptable Dynamics) is a novel concept of a pixel detector read-out chip especially developed for X-ray diffraction. This circuit, submitted in a 0.8 μm CMOS technology, contains 600 square pixels distributed into 24 columns of 25 elements each. The analogue part, gathering 2 cascaded amplifiers, uses the automatic pole-zero cancellation technique in order to keep the baseline stable even at counting rate as high as 107 photons per second. A fast discriminator allows a detection level from 5 keV (1200 electrons) to 50 keV. A new read-out concept based on a special overflow mechanism has been implemented for infinite dynamic range purposes. This technique permits also data transport during acquisition and motion reconstruction provided by some level of time tagging
Keywords :
CMOS integrated circuits; X-ray detection; amplifiers; discriminators; nuclear electronics; silicon radiation detectors; 0.8 micron; CMOS; X-ray counting; automatic pole-zero cancellation; cascaded amplifiers; discriminator; dynamic range; hybrid pixel detectors; overflow mechanism; read-out pixel chip; signal to noise ratio; time tagging; Biomedical equipment; CMOS technology; Dynamic range; Medical services; Medical signal detection; Physics; Signal to noise ratio; X-ray detection; X-ray detectors; X-ray diffraction;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
Print_ISBN :
0-7803-6503-8
DOI :
10.1109/NSSMIC.2000.949877