DocumentCode
1752343
Title
A “cold” discharge mechanism for low-noise fast charge amplifiers
Author
Pullia, A. ; Bassini, R. ; Boiano, C. ; Brambilla, S.
Author_Institution
Dipt. di Fisica, Univ. Statale di Milano, Italy
Volume
2
fYear
2000
fDate
2000
Abstract
We present a new discharge mechanism for low-noise fast preamplifiers for γ-ray spectroscopy. Such circuital solution has been conceived in the framework of the INFN Mars experiment, which imposes stringent requirements for both the signal-to-noise ratio and the rise time of the front-end preamplifiers. Basically a non-inverting low-gain (G) stage is interposed between the output of a conventional charge amplifier and the high-value feedback resistor. It can be easily found that this adds no noise but the discharge time constant is reduced by a factor G, because the voltage drop across the resistor is G times as high, and such is the discharge current. A similar effect could also be obtained in the standard charge amplifier by diminishing the feedback resistor by a factor G. But this would yield an increase of a factor G of its thermal current noise. In this sense our equivalent discharge resistor is “cold”, because it carries a current noise G times as low. This permits us to use a relatively large feedback capacitance which inherently yields a fast risetime. A rise time of 15 ns and an overall electronic noise of 1.03 keV fwhm at 3 μs shaping time have been obtained, with an input capacitance of 33 pF, 1.5 pF feedback capacitor, 150 μs discharge time constant
Keywords
electron device noise; nuclear electronics; preamplifiers; 1.03 keV; 1.5 pF; 33 pF; discharge; discharge current; electronic noise; feedback capacitor; low-noise fast charge amplifiers; low-noise fast preamplifiers; signal-to-noise ratio; thermal current noise; Capacitance; Circuits; Mars; Noise reduction; Noise shaping; Output feedback; Preamplifiers; Resistors; Signal to noise ratio; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location
Lyon
ISSN
1082-3654
Print_ISBN
0-7803-6503-8
Type
conf
DOI
10.1109/NSSMIC.2000.949899
Filename
949899
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