Development of front-end electronics for Belle SVD Upgrades

Author

Aihara, H. ; Hazumi, M. ; Ishino, H. ; Kaneko, J. ; Li, Y. ; Marlow, D. ; Mikkelsen, S. ; Nguyen, D. ; Nygaard, E. ; Tajima, H. ; Talebi, J. ; Varner, G. ; Yamamoto, H. ; Yokoyama, M.

Author_Institution

Dept. of Phys., Tokyo Univ., Japan

Volume

2

fYear

2000

fDate

2000

Abstract

Essential to the ongoing improvement in the vertexing capability of the Belle detector at the KEK-B Factory are evolutionary enhancements to the Silicon Vertex Detector (SVD). A critical component of this improvement has been the refinement of the successful Viking Architecture (VA) front-end electronics for adaptation to the high-luminosity, B-Factory environment. Specifically, improvements have focussed on the areas of improving radiation hardness and reducing the minimum shaping time. The adjustments allow for a substantially longer SVD lifetime at peak performance and the minimization of background occupancy, respectively. In addition, to increase the strip yield of our sensors, we have implemented two different techniques to allow for DC coupling of the VA chips. Results are reported on the success of this R&D program

Keywords

nuclear electronics; radiation hardening (electronics); silicon radiation detectors; Belle detector; Si; Silicon Vertex Detector; Viking Architecture; front-end electronics; radiation hardness; Accidents; Fabrication; Physics; Process design; Production facilities; Radiation detectors; Research and development; Silicon; Strips; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2000 IEEE

Conference_Location

Lyon

ISSN

1082-3654

Print_ISBN

0-7803-6503-8

Type

conf

DOI

10.1109/NSSMIC.2000.949903

Filename

949903