Title :
Development of fluorocarbon evaporative cooling recirculators and controls for the ATLAS inner silicon tracker
Author :
Bayer, C. ; Berry, S. ; Bonneau, P. ; Bosteels, M. ; Burckhart, H. ; Cragg, D. ; English, R. ; Hallewell, G. ; Hallgren, B. ; Ilie, Simona ; Kersten, S. ; Kind, P. ; Langedrag, K. ; Lindsay, S. ; Merkel, M. ; Stapnes, S. ; Thadome, J. ; Vacek, V.
Author_Institution :
Dept. of Phys., Wuppertal Univ., Germany
Abstract :
We report on the development of evaporative fluorocarbon cooling recirculators and their control systems for the ATLAS inner silicon tracker. We have developed a prototype circulator using a dry, hermetic compressor with C3F8 refrigerant, and have prototyped the remote-control analog pneumatic links for the regulation of coolant mass flows and operating temperatures that will be necessary in the magnetic field and radiation environment around ATLAS. Temperature, pressure and flow measurement and control use 150+ channels of standard ATLAS LMB (“Local Monitor Board”) DAQ and DACs on a multi-drop CAN network administered through a BridgeVIEW user interface. A hardwired thermal interlock system has been developed to cut power to individual silicon modules should their temperatures exceed safe values. Highly satisfactory performance of the circulator under steady state, partial-load and transient conditions was seen, with proportional fluid flow tuned to varying circuit power. Future developments, including a 6 kW demonstrator with ~25 cooling circuits, are outlined
Keywords :
cooling; silicon radiation detectors; ATLAS inner silicon tracker; BridgeVIEW user interface; dry hermetic compressor; fluorocarbon evaporative cooling recirculators; hardwired thermal interlock system; multi-drop CAN network; proportional fluid flow; remote-control analog pneumatic links; Control systems; Coolants; Cooling; Fluid flow measurement; Magnetic field measurement; Pressure measurement; Prototypes; Refrigerants; Silicon; Temperature control;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
Print_ISBN :
0-7803-6503-8
DOI :
10.1109/NSSMIC.2000.949918