DocumentCode
175238
Title
A 1.8 dB NF blocker-filtering noise-canceling wideband receiver with shared TIA in 40nm CMOS
Author
Hedayati, Hajir ; Lau, Wing-Fat Andy ; Namsoo Kim ; Aparin, Vladimir ; Entesari, Kamran
Author_Institution
AMSC, Texas A&M Univ., College Station, TX, USA
fYear
2014
fDate
1-3 June 2014
Firstpage
325
Lastpage
328
Abstract
This paper presents a high performance two-path wideband receiver (RX) for mobile applications. The RX uses an extra gain stage after the LNA to significantly improve the noise figure (NF). Furthermore, different RF and baseband blocker rejection techniques are proposed to significantly improve the linearity of the RX. The blockers are first rejected after the LNA stage through an N-path filter. Then, a novel base-band blocker filtering (BBBF) technique improves IIP3 by 7 dB. A dual mixer architecture is also employed to attenuate blockers both before and after the mixer stage. The N-path filter noise is sensed out-of-phase by the main path and cancelled at the inputs of the shared TIA. The RX achieves 1.8 dB NF with 50 dB gain at 2 GHz in 40nm CMOS technology. The RX out-of-band IIP3 is +5 dBm, which is improved by 20 dB by the proposed techniques, while consuming 36 mW.
Keywords
CMOS integrated circuits; UHF integrated circuits; UHF mixers; filtering theory; mobile radio; radio receivers; BBBF technique; CMOS technology; LNA; N-path filter noise; RF blocker rejection techniques; RX out-of-band IIP3; baseband blocker filtering technique; baseband blocker rejection techniques; blocker-filtering noise-canceling wideband receiver; dual mixer architecture; frequency 2 GHz; gain 50 dB; mobile applications; noise figure 1.8 dB; power 36 mW; shared TIA; size 40 nm; Band-pass filters; Frequency measurement; Mixers; Noise; Noise measurement; Receivers; Wideband; Wideband receiver; baseband blocker filtering; blocker filtering; noise cancellation; out of band blocker; trans-impedance amplifier;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Frequency Integrated Circuits Symposium, 2014 IEEE
Conference_Location
Tampa, FL
ISSN
1529-2517
Print_ISBN
978-1-4799-3862-9
Type
conf
DOI
10.1109/RFIC.2014.6851732
Filename
6851732
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