DocumentCode :
1752389
Title :
The transient response analysis of EMP coupling through apertures
Author :
Zhe, Yan ; Xin, Yang ; Xiaoliang, Bi ; JiaXiang, Yang
Author_Institution :
Harbin University of Science Technology
Volume :
2
fYear :
2006
fDate :
14-18 Aug. 2006
Firstpage :
526
Lastpage :
528
Keywords :
Apertures; Circuit testing; Computational modeling; Coupling circuits; EMP radiation effects; Fourier transforms; Frequency measurement; Transient analysis; Transient response; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
Type :
conf
DOI :
10.1109/ISEMC.2006.1706361
Filename :
1706361
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1752389
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