Title :
An integrated hybrid solver and measurements for EMI/EMC analysis of cables and PCBs enclosed within metallic structures
Author :
Khan, Zulfiqar A. ; Bayram, Yakup ; Volakis, John L.
Author_Institution :
The Ohio State University
Keywords :
Cables; Coupling circuits; Electromagnetic compatibility; Electromagnetic interference; Equations; Integrated circuit interconnections; Scattering parameters; Transmission line matrix methods; Transmission line theory; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
DOI :
10.1109/ISEMC.2006.1706363