DocumentCode
1753215
Title
Cost-Driven Repair of a Nanowire Crossbar Architecture
Author
Yellambalase, Yadunandana ; Zhang, Shanrui ; Choi, Minsu ; Park, Nohpill ; Lombardi, Fabrizio
Author_Institution
Dept of ECE, University of Missouri-Rolla, Rolla, MO 65409-0040, USA, ypymy9@umr.edu
Volume
1
fYear
2006
fDate
17-20 June 2006
Firstpage
347
Lastpage
350
Abstract
The recent development of nanoscale materials and assembly techniques has resulting in the manufacturing of high-density computational systems. These systems consist of nanometer-scale elements and are likely to have many manufacturing imperfections (defects); thus, defect-tolerance is considered as one of the most some algorithms for repairing defective crosspoints in a nanoscale crossbar architecture; furthermore we estimate the efficiency and cost-effectiveness of each algorithm. Also, for a given design and manufacturing environment, we propose a cost-driven method to find a balanced solution by which figures of merit such as area, repair time and reconfiguration cost can be taken into account. Probabilistic parameters are utilized in the proposed cost-driven method for added flexibility.
Keywords
Automatic testing; Carbon nanotubes; Chemicals; Computer architecture; Costs; Manufacturing; Nanoscale devices; Self-assembly; Silicon; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
Print_ISBN
1-4244-0077-5
Type
conf
DOI
10.1109/NANO.2006.247648
Filename
1717098
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