• DocumentCode
    1753215
  • Title

    Cost-Driven Repair of a Nanowire Crossbar Architecture

  • Author

    Yellambalase, Yadunandana ; Zhang, Shanrui ; Choi, Minsu ; Park, Nohpill ; Lombardi, Fabrizio

  • Author_Institution
    Dept of ECE, University of Missouri-Rolla, Rolla, MO 65409-0040, USA, ypymy9@umr.edu
  • Volume
    1
  • fYear
    2006
  • fDate
    17-20 June 2006
  • Firstpage
    347
  • Lastpage
    350
  • Abstract
    The recent development of nanoscale materials and assembly techniques has resulting in the manufacturing of high-density computational systems. These systems consist of nanometer-scale elements and are likely to have many manufacturing imperfections (defects); thus, defect-tolerance is considered as one of the most some algorithms for repairing defective crosspoints in a nanoscale crossbar architecture; furthermore we estimate the efficiency and cost-effectiveness of each algorithm. Also, for a given design and manufacturing environment, we propose a cost-driven method to find a balanced solution by which figures of merit such as area, repair time and reconfiguration cost can be taken into account. Probabilistic parameters are utilized in the proposed cost-driven method for added flexibility.
  • Keywords
    Automatic testing; Carbon nanotubes; Chemicals; Computer architecture; Costs; Manufacturing; Nanoscale devices; Self-assembly; Silicon; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
  • Print_ISBN
    1-4244-0077-5
  • Type

    conf

  • DOI
    10.1109/NANO.2006.247648
  • Filename
    1717098