DocumentCode :
1753816
Title :
TSC Characteristics of Aged ZnO Varistors under Different Applied Voltage Ratios
Author :
Cui, Hang ; Wang, Qian ; Tu, Youping
Author_Institution :
Beijing Key Lab. of High Voltage & EMC, North China Electr. Power Univ., Beijing, China
fYear :
2011
fDate :
25-28 March 2011
Firstpage :
1
Lastpage :
4
Abstract :
ZnO varistors have high nonlinearity, which are widely utilized in protecting power systems and electronic devices against the dangerous over-voltages or surges, and the ac aging characteristic of ZnO varistors is widely concerned. In this paper, the thermally stimulated current (TSC) characteristic, U-I characteristic and power loss characteristic performance of aging ZnO varistors have been investigated in different conditions. The experimental results show that with the increase of aging voltage, the power loss increases, U-I characteristic drifts, the trapped charges experimented by TSC increase that causes the decrease of the height of Schottky barrier aggravating, which would lead to the aging of ZnO varistors; the trend of power loss characteristic and U-I characteristic is consistent with the trend of TSC characteristic. Consequently, the thermally stimulated current experiment is an effective method to present the aging degree of ZnO varistors.
Keywords :
II-VI semiconductors; ageing; power system protection; thermally stimulated currents; varistors; wide band gap semiconductors; zinc compounds; AC aging characteristic; Schottky barrier aggravating; TSC characteristics; U-I characteristic drifts; ZnO; electronic devices; overvoltages; power loss characteristic performance; power systems protection; thermally stimulated current characteristic; varistor aging; Aging; Dielectric losses; Resistance; Temperature; Temperature measurement; Varistors; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power and Energy Engineering Conference (APPEEC), 2011 Asia-Pacific
Conference_Location :
Wuhan
ISSN :
2157-4839
Print_ISBN :
978-1-4244-6253-7
Type :
conf
DOI :
10.1109/APPEEC.2011.5748837
Filename :
5748837
Link To Document :
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