• DocumentCode
    1753930
  • Title

    CMP oxide slurry recycle system implementation

  • Author

    Hsu, Jack ; Wann, Y.J. ; Pai, J.R.

  • Author_Institution
    TSMC (Taiwan Semicond. Manuf. Co.), Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    18-20 Oct. 2010
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    This paper demonstrates and realizes that the Chemical Mechanical Polishing (CMP) oxide slurry could be recycled to CMP process again. By the slurry recycling process, 90% waste slurry could be reclaimed and also over 90% wastewater could be recycled and reuse in integrated circuits (ICs) process. The demonstrated reclaimed slurry show compatible removal rate (R/R) and the same uniformity (U%) of R/R. Also the compatible R/R profile and defectives level.
  • Keywords
    chemical mechanical polishing; integrated circuit manufacture; recycling; slurries; wastewater; CMP oxide slurry recycle system; chemical mechanical polishing; integrated circuits process; waste slurry reclaimation; wastewater recycling; wastewater reuse; Receivers; Slurries;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing (ISSM), 2010 International Symposium on
  • Conference_Location
    Tokyo
  • ISSN
    1523-553X
  • Print_ISBN
    978-1-4577-0392-8
  • Electronic_ISBN
    1523-553X
  • Type

    conf

  • Filename
    5750196