DocumentCode
1754177
Title
Keynote speakers day 1: 3D integration with TSV interconnects: Technology trends & market analysis
Author
Zinck, Christophe
Author_Institution
Yole Développement France
fYear
2010
fDate
16-18 Nov. 2010
Firstpage
1
Lastpage
2
Abstract
Christophe joined Yole Développement after several positions in the wafer fab and packaging environments of CEA-Leti, STMicroelectronics and then TriQuint Semiconductor, where he has developed Wafer Level packaging technology and flipchip technology for SAW duplexers. He is now project manager at Yole for Advance Packaging, WLP & 3D system Integration and RF devices.
Keywords
Conferences; Nanoscale devices; Packaging; Radio frequency; System-on-a-chip; Three dimensional displays; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
3D Systems Integration Conference (3DIC), 2010 IEEE International
Conference_Location
Munich, Germany
Print_ISBN
978-1-4577-0526-7
Type
conf
DOI
10.1109/3DIC.2010.5751427
Filename
5751427
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