Title :
Experimental characterisations of thin film transmission line losses
Author :
Kim, Dongkyu ; Kim, Heonhwan ; Eo, Y.
Author_Institution :
Dept. of Electron. & Commun. Eng., Hanyang Univ., Ansan, South Korea
Abstract :
New frequency-variant losses of planar thin film transmission lines are experimentally investigated in a broad frequency range. The frequency-variant transmission line parameters are accurately determined in the measured frequency band (i.e. from 40 MHz to 50 GHz). Then, it is shown that there are three critical frequencies that characterise the loss mechanism of thin film transmission lines. The conventional skin-effect model is not accurate in thin and fine transmission lines.
Keywords :
losses; thin film devices; transmission lines; bandwidth 40 MHz to 50 GHz; experimental characterisations; frequency band measurement; frequency range; frequency-variant losses; frequency-variant transmission line parameters; loss mechanism characterization; planar thin film transmission lines;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2013.1444
