Title :
Diverse Double Modular Redundancy: A New Direction for Soft-Error Detection and Correction
Author :
Reviriego, P. ; Bleakley, C.J. ; Maestro, J.A.
Author_Institution :
Univ. Antonio de Nebrija, Madrid, Spain
Abstract :
By introducing diversity between original and redundant modules, diverse double modular redundancy is a promising solution to mitigate the impact of soft errors.
Keywords :
integrated circuit design; radiation hardening (electronics); diverse double modular redundancy; soft-error correction; soft-error detection; Digital signal processing; Error analylsis; Error correction; Finite impulse response filter; Integrated circuit reliability; Redundancy; Software reliability; Tunneling magnetoresistance; Error correction; Modular redundancy; Reliability; Soft error;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDT.2012.2232964
