DocumentCode :
1754859
Title :
Measurement of Temperature-Dependent Polarization Parameters in Long-Wavelength VCSELs
Author :
Quirce, Ana ; Valle, Angel ; Pesquera, Luis ; Thienpont, Hugo ; Panajotov, Krassimir
Author_Institution :
Fac. of Eng. Sci., Vrije Univ. Brussel, Brussels, Belgium
Volume :
21
Issue :
6
fYear :
2015
fDate :
Nov.-Dec. 2015
Firstpage :
1
Lastpage :
7
Abstract :
Measurements of the polarization-resolved characteristics of a 1550-nm vertical-cavity surface-emitting laser (VCSEL) as a function of the temperature are presented. Type I (from the high-frequency to the low-frequency polarization mode) and Type II (from the low-frequency to the high-frequency polarization mode) polarization switchings (PS) are found in our device. Double PS (Type II followed by Type I and vice versa) are found when increasing the bias current for different device temperatures. Type II polarization switching to the gain disfavored mode is obtained. PS current, nonlinear dichroism, differential gain, and threshold current are measured as a function of the temperature. An expression relating these quantities to the spin-flip rate is derived. Using this expression, we have found large values of the spin-flip rate and its temperature dependence. The spin-flip rate increases with temperature except in a narrow temperature region in which a local minimum is observed. This behavior is mainly determined by the dependence of the inverse of the nonlinear dichroism on the temperature.
Keywords :
laser beams; laser modes; laser variables measurement; nonlinear optics; optical switches; surface emitting lasers; thermo-optical effects; PS current; bias current; device temperatures; differential gain; double PS; gain disfavored mode; high-frequency polarization mode; long-wavelength VCSEL; low-frequency polarization mode; narrow temperature region; nonlinear dichroism; polarization-resolved characteristics; spin-flip rate; temperature dependence; temperature function; temperature-dependent polarization parameter measurement; threshold current; type I polarization switching; type II polarization switching; vertical-cavity surface-emitting laser; wavelength 1550 nm; Current measurement; Frequency measurement; Temperature; Temperature dependence; Temperature measurement; Threshold current; Vertical cavity surface emitting lasers; (VCSELs); Parameter estimation; polarization switching; vertical-cavity surface-emitting lasers (VCSELs);
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2015.2410260
Filename :
7055239
Link To Document :
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