Structural Order and Staebler–Wronski Effect in Hydrogenated Amorphous Silicon Films and Solar Cells

The structure of hydrogenated amorphous silicon films is investigated by Raman spectroscopy and X-ray diffraction. Raman spectroscopy probes the phonon density of states, whereas X-ray diffraction measures the distribution of the electron density. Yet, both methods can yield information on the microstructure of the material represented by certain parameters like, e.g., the position or the width of the transverse optical phonon or the width of the first scattering peak. Interdependences between these parameters are investigated and evaluated. A correlation was found between the structural disorder and the relative efficiency loss caused by the Staebler-Wronski effect for intrinsic films applied as absorbing layers in solar cells. This correlation could be used to estimate the solar cell degradation without time-consuming light-soaking experiments.