Title :
Flexible Complementary Logic Gates Using Inkjet-Printed Polymer Field-Effect Transistors
Author :
Baeg, Kang-Jun ; Khim, Dongyoon ; Kim, Juhwan ; Kim, Dong-Yu ; Sung, Si-Woo ; Yang, Byung-Do ; Noh, Yong-Young
Author_Institution :
Convergence Components & Mater. Res. Lab., Electron. & Telecommun. Res. Inst., Daejeon, South Korea
Abstract :
High-performance inkjet-printed top-gate/bottom-contact organic field-effect transistors (OFETs) and complementary electronic circuitry are reported. Blends of poly(vinylidenefluoride-trifluoroethylene) (P(VDF-TrFE)) and poly(methyl methacrylate) (PMMA) dielectrics effectively reduce the operation voltage. At the optimized blend ratio of 7 : 3 wt.% for P(VDF-TrFE) and PMMA, both p- and n-type printed OFETs show well-balanced high field-effect mobility values (~ 0.5 cm2/V·s) and low threshold voltages ( ±5 V). The high-performance inverters and various digital logic gates such as nand, nor, or, and xor are demonstrated on flexible plastic substrates. The inverter shows a high gain (>; 25), an ideal inverting voltage near half of the supplied bias (1/2VDD), and a high noise immunity (up to 79 % of 1/2VDD).
Keywords :
NAND circuits; NOR circuits; dielectric materials; flexible electronics; ink jet printing; invertors; logic gates; organic field effect transistors; polymers; NAND logic gate; NOR logic gate; OR logic gate; P(VDF-TrFE); PMMA dieletrics; XOR logic gate; blend ratio optimization; complementary electronic circuitry; flexible complementary digital logic gate; flexible plastic substrate; inkjet-printed polymer field-effect transistor; inkjet-printed top-gate-bottom-contact organic field-effect transistor; inverter; n-type printed OFET; p-type printed OFET; poly (methyl methacrylate) dielectrics; poly (vinylidenefluoride-trifluoroethylene); threshold voltage; well-balanced high field-effect mobility value; Dielectrics; Inverters; Logic gates; Noise; OFETs; Polymers; Complimentary circuit; dielectric materials; inkjet; organic field-effect transistor (OFET); printed electronics;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2012.2226556