DocumentCode :
1755077
Title :
Battery-Powered Wireless Flux-Locked Loop Circuit for Operating High-Tc SQUID
Author :
Kandori, Akihiko ; Ogata, Kohichi ; Kawabata, R. ; Mizoguchi, T. ; Seki, Yoshiaki ; Tsukamoto, Arata ; Adachi, Shuichi ; Tanabe, Kazuki
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Volume :
23
Issue :
3
fYear :
2013
fDate :
41426
Firstpage :
1601204
Lastpage :
1601204
Abstract :
A battery-operated wireless flux-locked-loop (FLL) circuit for operating a high-Tc superconducting quantum interference device (SQUID) was developed and tested. This wireless battery-type FLL circuit consists of an FLL unit and a PC interface. A local area network with the TCP-IP protocol for wireless mode was used for communication between the PC interface and a controlling PC. The battery unit can power the FLL circuits for four hours. The FLL circuit had two bias modes: ac and dc. When the wireless-battery-type FLL circuit was implemented in a SQUID, the system noise generated by a wireless network became intrinsic high-Tc SQUID noise. Also, a 1/f noise was reduced in the case of the ac-bias-current mode. Consequently, the wireless-battery-type FLL circuit can operate a high-Tc SQUID with high sensitivity.
Keywords :
1/f noise; SQUIDs; high-temperature superconductors; phase locked loops; transport protocols; wireless LAN; 1/f noise; FLL unit; PC interface; TCP-IP protocol; ac-bias-current mode; battery unit; battery-powered wireless flux-locked loop circuit; high-temperature superconducting quantum interference device; intrinsic high-Tc SQUID noise; local area network; system noise; wireless battery-type FLL circuit; wireless mode; wireless network; Batteries; Frequency locked loops; Laboratories; Noise; SQUIDs; Wireless communication; Wireless sensor networks; Flux-locked-loop (FLL) circuit; high-temperature superconductors (HTS); superconducting-quantum-interference device (SQUID); wireless technologies;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2012.2231713
Filename :
6377269
Link To Document :
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