Title : 
Survey on Fault-Tolerant Techniques for Power Electronic Converters
         
        
            Author : 
Wenping Zhang ; Dehong Xu ; Enjeti, Prasad N. ; Haijin Li ; Hawke, J.T. ; Krishnamoorthy, Harish S.
         
        
            Author_Institution : 
Inst. of Power Electron., Zhejiang Univ., Hangzhou, China
         
        
        
        
        
        
        
        
            Abstract : 
With wide-spread application of power electronic converters in high power systems, there has been a growing interest in system reliability analysis and fault-tolerant capabilities. This paper presents a comprehensive review of conventional fault-tolerant techniques regarding power electronic converters in case of power semiconductor device failures. These techniques can be classified into four categories based on the type of hardware redundancy unit: switch-level, leg-level, module-level, and system-level. Also, various fault-tolerant methods are assessed according to cost, complexity, performance, etc. The intent of this review is to provide a detailed picture regarding the current landscape of research in power electronic fault-handling mechanisms.
         
        
            Keywords : 
fault tolerance; power convertors; power system faults; power system reliability; fault tolerant techniques; power electronic converters; power semiconductor device failures; system reliability analysis; Circuit faults; Fault tolerant systems; Fuses; Redundancy; Switches; Topology; Fault-tolerance; postfault operation; power electronic converters; system reliability;
         
        
        
            Journal_Title : 
Power Electronics, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TPEL.2014.2304561