DocumentCode :
1755275
Title :
A Precision CMOS Voltage Reference Exploiting Silicon Bandgap Narrowing Effect
Author :
Bo Wang ; Man Kay Law ; Bermak, Amine
Author_Institution :
Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
Volume :
62
Issue :
7
fYear :
2015
fDate :
42186
Firstpage :
2128
Lastpage :
2135
Abstract :
A compact voltage-mode bandgap voltage reference (BGR) is presented. Instead of using overhead circuits, the silicon bandgap narrowing effect is exploited for bipolar junction transistor´s (BJT) curvature reduction and residual curvature correction. Prototype measurements in a 0.18-μm standard CMOS process show that the curvature of the BJT is effectively reduced from its inherent 3.6 mV to 1.4 mV. The proposed BGR measures a minimum temperature coefficient of 8.7 ppm/°C from -55°C to 125°C by batch trimming one resistor. After a curvature trimming, it further improves to 4.1 ppm/°C. The BGR has a minimum supply voltage of 1.3 V, 4.3 μA nominal current consumption, 0.03%/V line sensitivity, and 2 mV/mA load sensitivity at 25°. The output rms noise in the 0.1~10 -Hz band measures 10.23 μV.
Keywords :
CMOS integrated circuits; energy gap; reference circuits; CMOS voltage reference; Si; bipolar junction transistor; compact voltage mode bandgap voltage reference; current 4.3 muA; curvature reduction; residual curvature correction; silicon bandgap narrowing effect; size 0.18 mum; voltage 1.3 V; Bipolar transistors; Noise; Photonic band gap; Resistors; Silicon; Topology; Transistors; BJT noise; Bandgap narrowing (BGN); CMOS bandgap voltage reference (BGR); bipolar junction transistor (BJT) curvature reduction; curvature correction; process spread; temperature coefficient (TC); temperature coefficient (TC).;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2015.2434495
Filename :
7118168
Link To Document :
بازگشت