DocumentCode
1755374
Title
Characterization and Reliability of Sintered Nanosilver Joints by a Rapid Current-Assisted Method for Power Electronics Packaging
Author
Yun-Hui Mei ; Yunjiao Cao ; Gang Chen ; Xin Li ; Guo-Quan Lu ; Xu Chen
Author_Institution
Tianjin Key Lab. of Adv. Joining Technol. & the Sch. of Mater. Sci. & Eng., Tianjin Univ., Tianjin, China
Volume
14
Issue
1
fYear
2014
fDate
41699
Firstpage
262
Lastpage
267
Abstract
A rapid current-assisted sintering technology (CAST) was used to bond electronic devices with nanosilver paste, which is a promising alternative compared with traditional solders. Instead of using an external heating source, the specimen and bonding material of nanosilver paste were heated by the alternating current whose current direction is not constant. Die-shear testing and hardness measurement were used to evaluate the bonding strength. The bonding strength and hardness increase with increasing the current and/or current-on time. CAST was able to sinter nanosilver in a very short time, i.e., less than 1 s. Scanning electron microscopy was used to characterize the microstructures of sintered silver joints. The reliability of the sintered joints by CAST was also evaluated by cyclic shearing tests. The joint by CAST could survive much longer time than that by the conventional hot pressing way. The CAST was recommended to bond two pieces of bare copper with nanosilver paste in power electronic applications without any protective gas atmosphere, e.g., bus bar connection.
Keywords
bonding processes; copper alloys; crystal microstructure; electronics packaging; nanoparticles; power electronics; reliability; scanning electron microscopy; shear strength; silver alloys; sintering; solders; CAST; Cu-Ag; alternating current; bare copper; bonding material; bonding strength; current-assisted sintering technology; cyclic shearing tests; die-shear testing; electronic devices; external heating source; hardness measurement; hot pressing; microstructure characterization; nanosilver paste; power electronic packaging; reliability; scanning electron microscopy; shear strength; sintered nanosilver joints; Bonding; Copper; Educational institutions; Heating; Joints; Materials; Silver; Copper; cycling; hardness; microstructures; shear strength; silver nanoparticles;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2013.2278979
Filename
6583225
Link To Document