• DocumentCode
    1755374
  • Title

    Characterization and Reliability of Sintered Nanosilver Joints by a Rapid Current-Assisted Method for Power Electronics Packaging

  • Author

    Yun-Hui Mei ; Yunjiao Cao ; Gang Chen ; Xin Li ; Guo-Quan Lu ; Xu Chen

  • Author_Institution
    Tianjin Key Lab. of Adv. Joining Technol. & the Sch. of Mater. Sci. & Eng., Tianjin Univ., Tianjin, China
  • Volume
    14
  • Issue
    1
  • fYear
    2014
  • fDate
    41699
  • Firstpage
    262
  • Lastpage
    267
  • Abstract
    A rapid current-assisted sintering technology (CAST) was used to bond electronic devices with nanosilver paste, which is a promising alternative compared with traditional solders. Instead of using an external heating source, the specimen and bonding material of nanosilver paste were heated by the alternating current whose current direction is not constant. Die-shear testing and hardness measurement were used to evaluate the bonding strength. The bonding strength and hardness increase with increasing the current and/or current-on time. CAST was able to sinter nanosilver in a very short time, i.e., less than 1 s. Scanning electron microscopy was used to characterize the microstructures of sintered silver joints. The reliability of the sintered joints by CAST was also evaluated by cyclic shearing tests. The joint by CAST could survive much longer time than that by the conventional hot pressing way. The CAST was recommended to bond two pieces of bare copper with nanosilver paste in power electronic applications without any protective gas atmosphere, e.g., bus bar connection.
  • Keywords
    bonding processes; copper alloys; crystal microstructure; electronics packaging; nanoparticles; power electronics; reliability; scanning electron microscopy; shear strength; silver alloys; sintering; solders; CAST; Cu-Ag; alternating current; bare copper; bonding material; bonding strength; current-assisted sintering technology; cyclic shearing tests; die-shear testing; electronic devices; external heating source; hardness measurement; hot pressing; microstructure characterization; nanosilver paste; power electronic packaging; reliability; scanning electron microscopy; shear strength; sintered nanosilver joints; Bonding; Copper; Educational institutions; Heating; Joints; Materials; Silver; Copper; cycling; hardness; microstructures; shear strength; silver nanoparticles;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2013.2278979
  • Filename
    6583225