DocumentCode :
1755401
Title :
Multiplexing Sense-Amplifier-Based Magnetic Flip-Flop in a 28-nm FDSOI Technology
Author :
Cai, Hao ; Wang, You ; Zhao, Weisheng ; de Barros Naviner, Lirida Alves
Author_Institution :
Dept. Commun. et Electron., Telecom-ParisTech, Paris, France
Volume :
14
Issue :
4
fYear :
2015
fDate :
42186
Firstpage :
761
Lastpage :
767
Abstract :
A novel low-power nonvolatile magnetic flip-flop is introduced in this paper. The perpendicular magnetic anisotropy spin torque transfer magnetic tunnel junction (STT-MTJ) is used to design the hybrid MTJ/CMOS circuit, which is implemented with 28-nm high-κ metal gate and planar ultrathin body and buried oxide fully depleted silicon on insulator technology. The proposed flip-flop structure named SA-MFF shares a sensing amplifier for normal flip-flop mode and nonvolatile data sensing mode. The modified latch at output stage improves flip-flop latency. The proposed SA-MFF is symmetrical, which provides an equal delay for both true and complementary outputs. It can strengthen weak input signals (minimum 300 mV) and latch them to supply voltage. Forward body biasing transistors allow for fast operation and minimum energy consumption across all modes. The proposed SA-MFF achieves 45.2-ps latency, 50.1-ps clock to output delay, 12.71 μW active power and 343.6 nW of leakage power with 1-V supply voltage, and 6.47-μm × 4.54 μm layout area. Moreover, reliability issues are highlighted with reliability-aware simulations. Process variations of transistors/MTJs and stochastic characteristics of MTJs are investigated. Clock jitter effect and flip-flop metastability are studied.
Keywords :
CMOS integrated circuits; elemental semiconductors; flip-flops; integrated circuit reliability; jitter; magnetic tunnelling; magnetoelectronics; perpendicular magnetic anisotropy; silicon; silicon-on-insulator; Si; active power; buried oxide fully depleted silicon on insulator technology; clock jitter effect; flip-flop latency; flip-flop metastability; forward body biasing transistors; high-κ metal gate; hybrid magnetic tunnel junction-CMOS circuit; layout area; leakage power; low-power nonvolatile magnetic flip-flop; minimum energy consumption; modified latch; multiplexing sense-amplifier-based magnetic flip-flop; nonvolatile data sensing mode; output delay; output stage; perpendicular magnetic anisotropy spin torque transfer magnetic tunnel junction; planar ultrathin body; power 12.71 muW; power 343.6 nW; process variations; reliability-aware simulations; size 28 nm; size 4.54 mum; size 6.47 mum; stochastic characteristics; supply voltage; time 45.2 ps; time 50.1 ps; voltage 1 V; voltage 300 mV; weak input signals; Clocks; Integrated circuit reliability; Latches; Logic gates; Magnetic tunneling; Transistors; FDSOI technology; flip-flops; integrated circuit reliability; magnetic tunneling;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2015.2438017
Filename :
7118215
Link To Document :
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