• DocumentCode
    1755739
  • Title

    A Fully Integrated SAR ADC Using Digital Correction Technique for Triple-Mode Mobile Transceiver

  • Author

    Nakane, Hideyuki ; Ujiie, Ryuichi ; Oshima, Toru ; Yamamoto, Takayuki ; Kimura, K. ; Okuda, Yukihiro ; Tsuiji, Kosuke ; Matsuura, T.

  • Author_Institution
    Renesas Electron. Corp., Kawasaki, Japan
  • Volume
    49
  • Issue
    11
  • fYear
    2014
  • fDate
    Nov. 2014
  • Firstpage
    2503
  • Lastpage
    2514
  • Abstract
    This paper presents a fully integrated SAR ADC for GSM/WCDMA/LTE triple-mode transceiver (RFIC) with non-binary DAC structure and digital correction techniques. All blocks including input buffer, ADC core, bias, references and ADC logics are implemented in a single chip with a small die area of 0.044 mm /0.066 mm for ADC core and ADC logic. The proposed ADC does not require off-chip decoupling capacitor for reference voltage by employing charge-sharing topology. Reconfigurable structure is used for multi-mode operation by adjusting ADC speed and noise, where SNDR of 67.0 dB in GSM and 58.2 dB in WCDMA/LTE are achieved at the sampling frequencies of 52 MS/s and 80 MS/s, respectively.
  • Keywords
    Long Term Evolution; analogue-digital conversion; buffer circuits; cellular radio; code division multiple access; digital-analogue conversion; radio transceivers; synthetic aperture radar; ADC logic block; GSM triple-mode mobile transceiver; LTE triple-mode mobile transceiver; Long Term Evolution; RFIC; WCDMA triple-mode mobile transceiver; bias block; charge-sharing topology; digital correction technique; fully integrated SAR ADC core block; global system for mobile communication; input buffer block; nonbinary DAC structure; reference voltage block; wideband CDMA; Capacitors; GSM; Multiaccess communication; Noise; Regulators; Spread spectrum communication; Voltage control; Asynchronous; SAR ADC; calibration; digital correction; passive amplifier; perturbation; reconfigurable; transceiver;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2014.2357436
  • Filename
    6913015