DocumentCode :
1756146
Title :
Closed-Form and Explicit Analytical Model for Crosstalk in CMOS Photodiodes
Author :
Blanco-Filgueira, Beatriz ; Lopez, Pierre ; Roldan, Juan B.
Author_Institution :
Centro de Investig. en Tecnol. de la Informacion, Univ. of Santiago de Compostela, Santiago de Compostela, Spain
Volume :
60
Issue :
10
fYear :
2013
fDate :
Oct. 2013
Firstpage :
3459
Lastpage :
3464
Abstract :
A closed-form and explicit 2-D analytical model for crosstalk(CTK) effects in p-n+ CMOS photodiodes for pixel design optimization has been developed in this paper. This model complements and extends a previous development describing the photocurrent because of the active area illumination along with the lateral depletion region and lateral components owing to the diffused photocarriers from the surroundings of the junction. The model has very few fitting parameters because it is physically based. Similarly, it can be of great use for CMOS image sensors designers, especially to fulfill high resolution and small area requirements by pixel size reduction. The model was validated extensively through device simulations with ATLAS and experimental data, and describes the CTK dependencies on light conditions and physical, geometrical, and process parameters.
Keywords :
CMOS image sensors; circuit simulation; image resolution; integrated circuit design; integrated circuit modelling; optical crosstalk; optimisation; p-n junctions; photoconductivity; photodetectors; photodiodes; photoemission; ATLAS simulation; CMOS image sensor designer; CTK effect; active area illumination; closed-form model; crosstalk effect; diffused photocarrier; explicit 2D analytical model; image resolution; lateral depletion region; p-n+ CMOS photodiode; photocurrent; pixel design optimization; pixel size reduction; Analytical models; Arrays; Fabrication; Junctions; Lighting; Photoconductivity; Semiconductor device modeling; Crosstalk(CTK); modeling; photodiodes(PDs); simulation;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2276748
Filename :
6583327
Link To Document :
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