Title :
Critical Current Properties in
Films With Nanorods Depending on Growth Conditions
Author :
Haruta, Makito ; Ichinose, Ataru ; Fujita, Norihisa ; Saura, K. ; Maeda, T. ; Horii, Shunsuke
Author_Institution :
Sch. of Environ. Sci. & Eng., Kochi Univ. of Technol., Kami, Japan
Abstract :
Growth temperature (Ts) dependent microstructures of nanorods were clarified for BaNb2O6 (BNO)-doped YBa2Cu3Oy (Y123) films. The morphology of BNO in the Y123 matrix was changed from fluctuated nanorods to uniform nanorods with the increase in Ts. Reflecting this change in the nanorod morphology, spatial distribution of local critical current density (Jcl) determined from the percolation transition model became sharp with the increase in Ts. The sharp distribution of Jcl led to a steep slope of electric field vs. current density curve and a sharp Jc peak under B//c in the magnetic field angular dependence. The evaluation of the distribution of Jcl is a strong tool to understand quantitatively the relationship between the microstructure of nanorods and critical current properties for RE123 films with nanorods. To optimize the critical current properties under the magnetic field for RE123 coated conductors with nanorods, precise control of Ts is very important in the production process.
Keywords :
barium compounds; critical current density (superconductivity); fluctuations in superconductors; high-temperature superconductors; nanofabrication; nanorods; percolation; superconducting thin films; superconducting transitions; yttrium compounds; YBCO:BaNb2O6; critical current properties; current density curve; electric field; fluctuated nanorods; growth property; magnetic field angular dependence; microstructure; microstructures; morphology; percolation transition model; thin films; Critical current; Films; Magnetic fields; Microstructure; Morphology; Temperature; Type II superconductors; Critical current properties; flux pinning; high temperature superconductors; nanorod; pulsed laser deposition;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2012.2233541