Title :
Entrainment of Micromechanical Limit Cycle Oscillators in the Presence of Frequency Instability
Author :
Blocher, David B. ; Zehnder, Alan T. ; Rand, Richard H.
Author_Institution :
Dept. of Mech. & Aerosp. Eng., Cornell Univ., Ithaca, NY, USA
Abstract :
The nonlinear dynamics of micromechanical oscillators are explored experimentally. Devices consist of singly and doubly supported Si beams, 200 nm thick and 35 μm long. When illuminated within a laser interference field, devices self-oscillate in their first bending mode due to feedback between laser heating and device displacement. Compressive prestress buckles doubly supported beams leading to a strong amplitude-frequency relationship. Significant frequency instability is seen in doubly supported devices. Self-resonant beams are also driven inertially with varying drive amplitude and frequency. Regions of primary, sub-, and superharmonic entrainment are measured. Statistics of primary entrainment are measured for low drive amplitudes, where the effects of frequency instability are measurable. Sub- and superharmonic entrainment are not seen in singly supported beams. A simple model is built to explain why high-order entrainment is seen only in doubly supported beams. Its analysis suggests that the strong amplitude-frequency relationship in doubly supported beams enables hysteresis, wide regions of primary entrainment, and high orders of sub- and superharmonic entrainment.
Keywords :
elemental semiconductors; laser beams; laser frequency stability; light interference; micro-optics; micromechanical devices; oscillators; silicon; Si; amplitude-frequency relationship; bending mode; compressive prestress; device displacement; doubly supported beams; doubly supported devices; drive amplitude; frequency instability; high-order entrainment; laser heating; laser interference field; micromechanical limit cycle oscillators; nonlinear dynamics; self-resonant beams; size 200 nm; size 35 mum; superharmonic entrainment; Frequency measurement; Laser beams; Limit-cycles; Measurement by laser beam; Oscillators; Power lasers; Resonant frequency; Limit cycles; micromechanical devices; optical resonators; oscillators; thermomechanical processes;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2013.2248124