Title :
Full-Gate Verification of Superconducting Integrated Circuit Layouts With InductEx
Author :
Fourie, Coenrad J.
Author_Institution :
Stellenbosch Univ., Stellenbosch, South Africa
Abstract :
At present, superconducting integrated circuit layouts are verified through a variety of techniques. A layout-versus-schematic method implemented in Cadence allows extraction of circuit schematics with certain geometry-dependent parameters. Lmeter calculates inductance in a layout network and, with proper setup, may also calculate resistance separately. Recently, InductEx was introduced to calculate multiterminal network inductance in a superconductor structure with support for more complicated 3-D geometries. Here, we present an improvement to InductEx that allows resistance, inductance, and Josephson junction critical current extraction of a full superconducting digital logic gate or cell in a single execution, as well as in reasonable time. We show how InductEx was designed to operate on tape-out ready layouts and, through example, how it is used for full-gate layout verification of contemporary logic cells.
Keywords :
integrated circuit layout; logic design; superconducting logic circuits; 3D geometry; Cadence; InductEx; Josephson junction critical current extraction; circuit schematic extraction; full superconducting digital logic gate; full-gate layout verification; geometry-dependent parameters; layout network; layout-versus-schematic method; multiterminal network inductance; superconducting integrated circuit layouts; superconductor structure; tape-out ready layouts; Fabrication; Impedance; Inductance; Integrated circuit modeling; Layout; Ports (Computers); Resistance; InductEx; Inductance extraction; layout verification; three-dimensional modeling;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2014.2360870