• DocumentCode
    1756743
  • Title

    An Approach to Recognize the Transient Disturbances With Spectral Kurtosis

  • Author

    Zhigang Liu ; Qiaoge Zhang

  • Author_Institution
    Sch. of Electr. Eng., Southwest Jiaotong Univ., Chengdu, China
  • Volume
    63
  • Issue
    1
  • fYear
    2014
  • fDate
    Jan. 2014
  • Firstpage
    46
  • Lastpage
    55
  • Abstract
    Spectral kurtosis (SK) is a statistical tool, which can indicate both non-Gaussian components in a signal and their locations in the frequency domain. The computation methods of SK decide the characteristics of transient disturbances. We propose a new computation method based on Choi-Williams distribution to recognize the transient disturbances. Through the comparisons and analysis of different computation methods for five transient disturbances, the proposed method can better reflect their characteristics difference. In addition, the relationships between SK and transient disturbance parameters (amplitude, phase, duration, noise, and so on) are analyzed and discussed in detail, and a recognition plan is proposed. We, respectively, adopted the simulation signals with random disturbance parameters and different noise, power systems computer aided design, and real-life signals to prove the recognition performance. The experimental results show that the method is feasible and simple, and the recognition rate of five transient disturbances is high and satisfied. Especially, the transient impulsive and oscillation with noise can be completely recognized using the proposed method in this paper.
  • Keywords
    power supply quality; power system measurement; power system transients; signal processing; statistical distributions; Choi-illiams distribution; disturbance parameter; impulsive signal; nonGaussian component; power system computer aided design; recognition performance; recognition plan; signal oscillation; spectral kurtosis; statistical tool; transient disturbance recognition; transient signal; Interrupters; Noise; Oscillators; Time-frequency analysis; Transient analysis; Voltage fluctuations; Choi–Williams distribution (CWD); disturbance parameters; recognition; spectral kurtosis (SK); transient disturbance;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2013.2277513
  • Filename
    6583959