Title :
The Study of Spectral Correction Algorithm of Charge-Coupled Device Array Spectrometer
Author :
Han-Kuei Fu ; Yen-Liang Liu ; Tzung-Te Chen ; Chien-Ping Wang ; Pei-Ting Chou
Author_Institution :
Electron. & Optoelectron. Res. Labs., Ind. Technol. Res. Inst., Hsinchu, Taiwan
Abstract :
The charge-coupled device (CCD) array spectrometer is used for quick and simultaneous measurement of light spectrum. In scientific research and industrial application, the spectral correction algorithm is important to obtain the accurate values of photometry and chromaticity. The accuracy of spectrum depends on the correction of wavelength position, the linearity correction of CCD, the elimination of noise and dark current, the bandpass correction, the stray light correction, and the correction of frequency response. Many correction algorithms are studied to improve the CCD array spectrometer measurement. In this paper, we review and compare the correction algorithms from the past literature. Furthermore, we integrate them and find out an optimal algorithm to process the correction of spectrum measurement. The best results of luminous flux correction (ΔY) and chromatic correction (Δu´v´) provide decreasing the difference of reference standard about 90%. The optimal correction algorithm provides a convenient method to enhance the measurement quality of CCD array spectrometer without changing the design of physical hardware.
Keywords :
charge-coupled device circuits; charge-coupled devices; noise abatement; photometry; spectrometers; stray light; CCD array spectrometer measurement; bandpass correction; charge-coupled device array spectrometer; chromatic correction; dark current elimination; frequency response; light spectrum measurement; luminous flux correction; noise elimination; photometry; spectral correction algorithm; stray light correction; wavelength position correction; Arrays; Charge coupled devices; Frequency response; Linearity; Noise reduction; Standards; Wavelength measurement; Array spectrometer; charge-coupled device (CCD); chromaticity; measurement quality; photometry;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2014.2358677