Degradation Characteristics of Superconducting Wires With Respect to Electrical Breakdown Tests

Author

Kang, Jong O. ; Onyou Lee ; Seungmin Bang ; Junil Kim ; Hongseok Lee ; Jonggi Hong ; Seokho Nam ; Tae Kuk Ko ; Yoon Do Chung ; Hyoungku Kang

Author_Institution

Dept. of Electr. Eng., Korea Nat. Univ. of Transp., Chungju, South Korea

Volume

25

Issue

3

fYear

2015

fDate

42156

Firstpage

1

Lastpage

4

Abstract

The electrical insulation design for a superconducting system is important when developing a high-voltage superconducting apparatus as a substitute for a conventional one. In this paper, the degradation characteristics of 2G high temperature superconducting (HTS) wires, with respect to electrical breakdown tests, were studied. It was found that the superconducting materials in 2G HTS wires can be damaged in electrical breakdown, and the damaged structure of 2G HTS wires results in the degradation of the Ic and index number. As a result, it was found that the degradation characteristics of the 2G HTS wires were affected by the stabilizer material and applied breakdown voltage. Thus, the hardness and electrical conductivity of a stabilizer material can be considered as design parameters in developing a high-voltage superconducting coil. Finally, the cross-sectional views of 2G HTS wires were presented using a scanning electron microscope.

Keywords

electric breakdown; electrical conductivity; hardness; high-temperature superconductors; scanning electron microscopy; superconducting coils; 2G high temperature superconducting wires; SEM; applied breakdown voltage; damaged structure; degradation characteristics; design parameters; electrical breakdown tests; electrical conductivity; electrical insulation design; hardness; high-voltage superconducting coil; index number; scanning electron microscope; stabilizer material; Degradation; Electric breakdown; High-temperature superconductors; Indexes; Integrated circuits; Lightning; Wires; Critical current; HTS wires; critical current; degradation characteristics; electrical breakdown; index number; stabilizer;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2014.2381551

Filename

6985556