• DocumentCode
    1757288
  • Title

    Correction to “Improved Low-Voltage-Triggered SCR Structure for RF-ESD Protection” [Aug 13 1050-1052]

  • Author

    Ma, Fa-Jun ; Han, Yi ; Dong, Shuai ; Miao, Meng ; Liang, Hongjing

  • Author_Institution
    Institute of Microelectronics and Optoelectronics, Zhejiang University, Hangzhou, China
  • Volume
    34
  • Issue
    9
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    1199
  • Lastpage
    1199
  • Abstract
    There is an error in Fig. 1 in the above-named letter [ibid., vol. 34, no. 8, pp. 1050-1052, Aug. 2013]. The corrected figure is published here.
  • Keywords
    CMOS integrated circuits; Electrostatic discharges; Leakage currents; Radiofrequency integrated circuits; Rectifiers; Thyristors;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2013.2275615
  • Filename
    6584042
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1757288