Title :
Selecting Optimum Cloud Availability Zones by Learning User Satisfaction Levels
Author :
Unuvar, Merve ; Tosi, Stefania ; Doganata, Yurdaer N. ; Steinder, Malgorzata Gosia ; Tantawi, Asser N.
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
March-April 1 2015
Abstract :
Cloud service providers enable enterprises with the ability to place their business applications into availability zones across multiple locations worldwide. While this capability helps achieve higher availability with smaller failure rates, business applications deployed across these independent zones may experience different quality of service (QoS) due to heterogeneous physical infrastructures. Since the perceived QoS against specific requirements are not usually advertised by cloud providers, selecting an availability zone that would best satisfy the user requirements is a challenge. In this paper, we introduce a predictive approach to identify the cloud availability zone that maximizes satisfaction of an incoming request against a set of requirements. The prediction models are built from historical usage data for each availability zone and are updated as the nature of the zones and requests change. Simulation results show that our method successfully predicts the unpublished zone behavior from historical data and identifies the availability zone that maximizes user satisfaction against specific requirements.
Keywords :
cloud computing; human factors; quality of service; availability zones; business applications; cloud service providers; failure rates; heterogeneous physical infrastructures; historical usage data; incoming request; optimum cloud availability zone selection; perceived QoS; quality of service; unpublished zone behavior prediction; user requirements; user satisfaction levels; Availability; History; Monitoring; Predictive models; Quality of service; Training; Vectors; Availability zones; cloud; multiple data centers; performance analysis; predictive analytics;
Journal_Title :
Services Computing, IEEE Transactions on
DOI :
10.1109/TSC.2014.2381225