Title :
Dynamic and Transient Analysis of Silicon-Based Thin-Film Transistors: Channel Propagation Model
Author :
Jin, Jong W. ; Vanel, J.-C. ; Daineka, Dmitri ; Mohammed-Brahim, T. ; Bonnassieux, Yvan
Author_Institution :
LPICM, Ecole Polytech., Palaiseau, France
Abstract :
The quasi-static approach in the dynamic modeling considers that a thin-film transistor (TFT) reaches the steady-state instantaneously, and how to insert its behavior before steady-state is an important issue. In this paper, dynamic responses of silicon-based TFTs under gate-voltage pulse are studied in details. We experimentally distinguish quasi-static and non-quasi-static cases and we identify two charging regimes of the channel formation: channel propagation and charging of the fully propagated channel. We propose a model for the channel propagation, with a compact model-like approach to take into account the effect of defect states.
Keywords :
elemental semiconductors; semiconductor device testing; silicon; thin film transistors; channel propagation model; dynamic analysis; dynamic modeling; dynamic responses; gate-voltage pulse; quasi-static approach; silicon-based thin-film transistors; transient analysis; Capacitance; Electrodes; Integrated circuit modeling; Logic gates; Mathematical model; Semiconductor device modeling; Thin film transistors; Channel formation; delay time; dynamic measurement; intrinsic capacitances; non-quasi-static model; thin-film transistor (TFT); transient;
Journal_Title :
Display Technology, Journal of
DOI :
10.1109/JDT.2013.2250912