• DocumentCode
    1757640
  • Title

    Current Crowding Phenomenon: Theoretical and Direct Correlation With the Efficiency Droop of Light Emitting Diodes by a Modified ABC Model

  • Author

    Liancheng Wang ; Zi-Hui Zhang ; Ning Wang

  • Author_Institution
    Semicond. Lighting Technol. R&D Center, Inst. of Semicond., Beijing, China
  • Volume
    51
  • Issue
    5
  • fYear
    2015
  • fDate
    42125
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    By incorporating current crowding effect into the conventional ABC model, we theoretically and directly uncover the black box of the relationship between the current diffusion and the internal quantum efficiency, light extraction efficiency, and external quantum efficiency droop of the light emitting diodes (LEDs). A general formula for the current diffusion length (Ls) has been derived. The design strategies on the current blocking layer and the transparent conductive layer to increase the Ls have been analyzed. The impact of the vertical resistance (Rs) on the LED wall-plug efficiency (WPE) has also been addressed. We have found there exists an optimized Rs, and the LED WPE is not always monotonically increasing as the Rs decreases. Besides, our previous experiment results have been summarized to verify the theoretical analysis.
  • Keywords
    light emitting diodes; light sources; optical multilayers; LED wall-plug efficiency; conventional ABC model; current blocking layer; current crowding phenomenon; current diffusion length; design strategies; external quantum efficiency droop; internal quantum efficiency; light emitting diodes; light extraction efficiency; modified ABC model; transparent conductive layer; vertical resistance; Current density; Electrodes; Integrated circuit modeling; Light emitting diodes; Mathematical model; Proximity effects; Resistance; Efficiency droop; current blocking layer; current crowding effect; light emitting diodes; transparent conductive layer;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2015.2409305
  • Filename
    7055868