Title :
10–315-MHz Cascaded Hybrid Phase-Locked Loop for Pixel Clock Generation
Author :
Minyoung Song ; Young-Ho Kwak ; Sunghoon Ahn ; Hojin Park ; Chulwoo Kim
Author_Institution :
Sch. of Electr. Eng., Korea Univ., Seoul, South Korea
Abstract :
A cascaded hybrid phase-locked loop (PLL) fabricated in a 65-nm CMOS process consumes 21 mW and occupies 0.4 mm2. An all-digital PLL (ADPLL) with piecewise linear calibrated hierarchical time-to-digital converter is proposed to achieve a wide operation range, and a charge-pump PLL (CPPLL) with an auxiliary (AUX) charge-pump for low current mismatch is cascaded to filter out the ADPLL output noise. The ADPLL achieves low long-term jitter regardless of the leakage current, and the CPPLL realizes low short-term jitter using a self-biased technique and the AUX charge pump. A phase-selectable divider is also proposed to divide the clock frequency while keeping the relative phase difference constant. The measured peak-to-peak short-term and long-term jitters at an output frequency of 315 MHz are 40 and 70 pspp, respectively, with a multiplication factor of 1024.
Keywords :
CMOS integrated circuits; digital phase locked loops; jitter; piecewise linear techniques; time-digital conversion; ADPLL; CPPLL; all-digital PLL; auxiliary charge-pump; cascaded hybrid PLL; charge-pump PLL; clock frequency; frequency 10 MHz to 315 MHz; low current mismatch; low long-term jitter; low short-term jitter; phase-locked loop; phase-selectable divider; piecewise linear calibrated hierarchical time-to-digital converter; pixel clock generation; power 21 mW; relative phase difference; size 65 nm; Clocks; Jitter; Leakage current; Phase locked loops; Phase noise; Synchronization; Voltage-controlled oscillators; All-digital phase-locked loop; jitter reduction; pixel clock generation; time-to-digital converter;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2012.2227068