• DocumentCode
    1757714
  • Title

    Micromagnetic Evaluation of Size Effects on the Critical Curves of Synthetic Antiferromagnetic Structures

  • Author

    Pinzaru, Ciprian ; Stoleriu, Laurentiu ; Stancu, Alexandru

  • Author_Institution
    Fac. of Phys. & CARPATH, Alexandru Ioan Cuza Univ. of Iasi, Iasi, Romania
  • Volume
    50
  • Issue
    7
  • fYear
    2014
  • fDate
    41821
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In many applications in which synthetic antiferromagnetic (SAF) structures are used, the most intricate problem is to design a magnetic field sequence to safely switch the AF coupled magnetic moments. In this paper, we analyze the switching of a SAF structure under a magnetic field pulse using the concept of critical curve (CC). To observe the size effects on the CCs, we have used a full micromagnetic simulation based on Magpar software package. The results have been compared with a simulation of the CCs with a simplified model using two macrospins coupled antiferromagnetically with the dynamics described by the Landau-Lifshitz-Gilbert equation. The differences between the two ways of simulation the same switching process are presented and discussed.
  • Keywords
    antiferromagnetism; ferromagnetism; finite element analysis; magnetic hysteresis; magnetic moments; magnetic structure; magnetic switching; magnetic thin films; micromagnetics; Landau-Lifshitz-Gilbert equation; Magpar software package; antiferromagnetic coupled magnetic moments; antiferromagnetically coupled macrospins; critical curve; full micromagnetic simulation; magnetic field sequence; size effects; switching; synthetic antiferromagnetic structures; Couplings; Magnetic anisotropy; Magnetic recording; Magnetostatics; Mathematical model; Micromagnetics; Switches; Critical curve (CC); macrospins synthetic antiferromagnetic (SAF) model; magnetic random access memory; micromagnetic model; synthetic antiferromagnetic (SAF);
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2014.2304916
  • Filename
    6733284