DocumentCode
1757994
Title
Testing a Nanocrossbar for Multiple Fault Detection
Author
Wenyi Feng ; Lombardi, Floriana ; Almurib, Haider A. F. ; Kumar, T. Nandha
Author_Institution
Microsemi Corp., San Jose, CA, USA
Volume
12
Issue
4
fYear
2013
fDate
41456
Firstpage
477
Lastpage
485
Abstract
This paper proposes an approach for testing a nanocrossbar switch; fault detection is considered in the presence of faulty switches and nets (of a permanent nature only) in the crossbar. To ensure detection, a one-to-one (onto) relationship in the setting (programming) of the switches is established in each of the configurations of the crossbar. This is accomplished using a constant-sum transformation of the characteristic matrix of the crossbar by utilizing different graph algorithms in O(N4.5) where N is the matrix dimension. Matrix properties are related to graph algorithms to generate permutation matrices as corresponding to the configurations (phases) of the crossbar. The conditions by which multiple faults are detected by the modified counting sequence (as test set), are proved. Simulation results are provided to further substantiate the validity of the proposed approach to test nanocrossbars of very large dimension and with different switch distribution.
Keywords
fault diagnosis; graph theory; matrix algebra; molecular electronics; nanoelectronics; switches; characteristic matrix; constant sum transformation; crossbar configurations; crossbar phases; fault detection; faulty nets; faulty switches; graph algorithms; modified counting sequence; nanocrossbar switch; one to one relationship; permutation matrices; programming setting; testing; Bipartite graph; Fault detection; Matrix decomposition; Programming; Switches; Testing; Time complexity; Crossbar; nanotechnology; testing;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2013.2252470
Filename
6479366
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