DocumentCode :
1758580
Title :
Design and Tests of the Vertically Integrated Photon Imaging Chip
Author :
Deptuch, Grzegorz W. ; Carini, Gabriella ; Grybos, Pawel ; Kmon, Piotr ; Maj, Piotr ; Trimpl, Marcel ; Siddons, David P. ; Szczygiel, Robert ; Yarema, Raymond
Author_Institution :
Electr. Eng. Dept., Fermi Nat. Accel. Lab., Batavia, IL, USA
Volume :
61
Issue :
1
fYear :
2014
fDate :
Feb. 2014
Firstpage :
663
Lastpage :
674
Abstract :
The Vertically Integrated Photon Imaging Chip (VIPIC) project explores opportunities of the three-dimensional integration for imaging of X-rays. The design details of the VIPIC1 chip are presented and are followed by results of testing of the chip. The VIPIC1 chip was designed in a 130 nm process, in which through silicon vias are embedded right after the front-end-of-line processing. The integration of tiers is achieved by the Cu-Cu thermo-compression or Cu-based oxide-oxide bonding. The VIPIC1 readout integrated circuit was designed for high timing resolution, pixel based, X-ray Photon Correlation Spectroscopy experiments typically using 8 keV X-rays at a synchrotron radiation facility. The design was done for bonding a Silicon pixel detector, however other materials can be serviced as long as the positive polarity of charge currents is respected.
Keywords :
X-ray imaging; copper; image sensors; integrated circuit design; integrated circuit testing; lead bonding; three-dimensional integrated circuits; Cu-Cu; VIPIC project; VIPIC1 chip; VIPIC1 readout integrated circuit; X-ray imaging; charge currents; electron volt energy 8 keV; front-end-of-line processing; oxide-oxide bonding; pixel based X-ray photon correlation spectroscopy experiments; positive polarity; silicon pixel detector; size 130 nm; synchrotron radiation facility; thermo-compression bonding; three-dimensional integration; through silicon vias; timing resolution; vertically integrated photon imaging chip; Bonding; Detectors; Imaging; Integrated circuits; Photonics; Three-dimensional displays; 3D-IC technology; CMOS; TSV; X-rays imaging detectors; integrated circuits; pixel detector; radiation imaging detectors; readout electronics; vertically integrated circuits;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2013.2294673
Filename :
6733392
Link To Document :
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