• DocumentCode
    1758644
  • Title

    Cold-capable, radiation-hardened SiGe BiCMOS wireline transceivers

  • Author

    England, Troy ; Chatterjee, Chandim ; Lourenco, Nuno ; Finn, Steven ; Najafizadeh, Laleh ; Phillips, Scott ; Kenyon, Eleazar ; Diestelhorst, Ryan ; Cressler, John

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    29
  • Issue
    3
  • fYear
    2014
  • fDate
    41699
  • Firstpage
    32
  • Lastpage
    41
  • Abstract
    Electronics in space-based systems are in the process of a paradigm shift moving from centralized, heavily shielded, temperature-controlled warm boxes to distributed, minimally shielded sensing and control nodes. SiGe BiCMOS technology is one of the enablers of this move with its ability to withstand extremely wide variations in temperature and high radiation doses. This article has presented two SiGe BiCMOS wireline transceivers designed to be a part of the new system perspective by creating a means of control and communication across vehicle-wide buses. Both the RS-485 and ISO 11898 transceivers have been shown to work robustly from 90 K to 390 K, with consistent rise/fall times, propagation delays, and output amplitudes. Additionally, the ISO 11898 transceiver is TID tolerant to 2 Mrad, and the transmitter is hardened to single-event effects.
  • Keywords
    BiCMOS integrated circuits; Ge-Si alloys; radiation hardening (electronics); transceivers; ISO 11898 transceiver; RS-485 transceiver; SiGe; TID tolerant; cold-capable radiation-hardened BiCMOS wireline transceiver; delay propagation; minimally shielded sensor; radiation dose; shielded temperature-controlled warm box; single-event effect; space-based system; temperature 90 K to 390 K; transmitter; vehicle-wide bus; Aeorospace electronics; BiCMOS integrated circuits; Radiation monitoring; Space research; Space vehicles; Temperature measurement; Transceivers;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/MAES.2014.6805364
  • Filename
    6805364