Title :
Calculating the Soft Error Vulnerabilities of Combinational Circuits by Re-Considering the Sensitive Area
Author :
Shuming Chen ; Yankang Du ; Biwei Liu ; Junrui Qin
Author_Institution :
Sci. & Technol. on Parallel & Distrib. Process. Lab., Nat. Univ. of Defense Technol., Changsha, China
Abstract :
Concepts of effective sensitive area and effective SET pulse width are proposed to model the actual sensitive area. Simulation results present that the soft error vulnerabilities got by using the effective sensitive area can be almost an order larger than the ones got by using the normal approach when the ion LET is 30 MeV ·cm2/mg. And heavy-ion experiments are conducted to demonstrate the simulation results.
Keywords :
combinational circuits; radiation hardening (electronics); combinational circuits; effective SET pulse width; effective sensitive area; ion LET; single event transient; soft error vulnerabilities; Combinational circuits; Inverters; Ions; Layout; Logic gates; MOSFET; Effective sensitive area; SET; pulse width; soft error vulnerabilities;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2014.2298889
