Title :
Hardware Acceleration of Online Error Detection in Many-Core Processors
Author :
Kamran, Arezoo ; Navabi, Zainalabedin
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. Coll. of Eng., Tehran, Iran
Abstract :
Due to worsening aging effects and incomplete testing and verification processes, systems being built in new fabrication technologies have encountered serious reliability challenges. A promising solution to these reliability challenges is self-test and self-reconfiguration with no or limited external control. In this paper, a scalable self-test mechanism for online testing of many-core processors has been proposed. Several hardware components are incorporated in the many-core architecture that distribute software test routines among the processing cores, monitor behavior of the processing cores during test routine execution, and detect faulty cores. A merit-based probabilistic test generation (MPTG) method to generate test for register-transfer level components considering the limitations imposed by the neighboring components has been proposed. In addition, a test generation approach utilizing MPTG has been proposed for software test routine generation in this environment. Experimental results show that the proposed test generation method results in good stuck-at fault coverage in a limited number of test cycles. In addition, the proposed test mechanism is extensively scalable in terms of hardware and timing overhead making it applicable to many-cores with a large number of processing cores.
Keywords :
built-in self test; fault tolerant computing; integrated circuit reliability; microprocessor chips; multiprocessing systems; program testing; MPTG; aging effects; fabrication technologies; faulty cores; hardware acceleration; hardware components; incomplete testing; many-core architecture; many-core processors; merit-based probabilistic test generation method; online error detection; register-transfer level components; reliability challenges; scalable self-test mechanism; self-reconfiguration; software test routine generation; stuck-at fault coverage; test cycles; test routine execution; timing overhead; verification processes; Buffer storage; Built-in self-test; Computer architecture; Fabrication; Hardware; Program processors; Many-core processor; online testing; probabilistic simulation; reliability; software-based self-test; test distribution;
Journal_Title :
Electrical and Computer Engineering, Canadian Journal of
DOI :
10.1109/CJECE.2015.2408373